ISO 25498-2010 微光束分析.解析电子显微测定法.透射式电子显微镜对选定区域进行电子衍射分析
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【英文标准名称】:Microbeamanalysis-Analyticalelectronmicroscopy-Selected-areaelectrondiffractionanalysisusingatransmissionelectronmicroscope
【原文标准名称】:微光束分析.解析电子显微测定法.透射式电子显微镜对选定区域进行电子衍射分析
【标准号】:ISO25498-2010
【标准状态】:现行
【国别】:国际
【发布日期】:2010-06
【实施或试行日期】:
【发布单位】:国际标准化组织(IX-ISO)
【起草单位】:ISO/TC202
【标准类型】:()
【标准水平】:()
【中文主题词】:分析;分析法;定义;衍射;电子束;电子衍射;电子显微镜;电子显微镜分析;分析方法;微量分析;显微术;光学仪器;换算;传输
【英文主题词】:Analysis;Analyticalmethods;Definitions;Diffraction;Electronbeams;Electrondiffraction;Electronmicroscopes;Electronmicroscopy;Methodsofanalysis;Microanalysis;Microscopy;Opticalinstruments;Scaling;Transmission
【摘要】:ThisInternationalStandardspecifiesthemethodofselected-areaelectrondiffraction(SAED)analysisusingatransmissionelectronmicroscope(TEM)toanalysemicrometerandsub-micrometersizedareasofthincrystallinespecimens.Suchspecimenscanbeobtainedintheformofthinsectionsfromavarietyofmetallicandnon-metallicmaterials,aswellasfinepowders,oralternativelybytheuseofextractionreplicas.Theminimumdiameteroftheselectedareainaspecimenwhichcanbeanalysedbythismethoddependsonthesphericalaberrationcoefficientoftheobjectivelensofthemicroscopeandapproaches0,5μmforamodernTEM.Whenthediameterofananalysedspecimenareaissmallerthan0,5μm,theanalysisprocedurecanalsobereferredtothisInternationalStandardbut,becauseoftheeffectofsphericalaberration,someofthediffractioninformationinthepatterncanbegeneratedfromoutsideoftheareadefinedbytheselected-areaaperture.Insuchcases,theuseofmicrodiffractionorconvergentbeamelectrondiffraction,whereavailable,mightbepreferred.Thesuccessoftheselected-areaelectrondiffractionmethodreliesonthevalidityofindexingthediffractionpatternsarising,irrespectiveofwhichaxisinthespecimenliesparalleltotheincidentelectronbeam.Suchanalysisisthereforeaidedbyspecimentiltandrotationfacilities.ThisInternationalStandardisapplicabletoacquisitionofSAEDpatternsfromcrystallinespecimens,indexingthepatternsandcalibrationofthediffractionconstant.
【中国标准分类号】:N33
【国际标准分类号】:71_040_50
【页数】:36P.;A4
【正文语种】:英语
【原文标准名称】:微光束分析.解析电子显微测定法.透射式电子显微镜对选定区域进行电子衍射分析
【标准号】:ISO25498-2010
【标准状态】:现行
【国别】:国际
【发布日期】:2010-06
【实施或试行日期】:
【发布单位】:国际标准化组织(IX-ISO)
【起草单位】:ISO/TC202
【标准类型】:()
【标准水平】:()
【中文主题词】:分析;分析法;定义;衍射;电子束;电子衍射;电子显微镜;电子显微镜分析;分析方法;微量分析;显微术;光学仪器;换算;传输
【英文主题词】:Analysis;Analyticalmethods;Definitions;Diffraction;Electronbeams;Electrondiffraction;Electronmicroscopes;Electronmicroscopy;Methodsofanalysis;Microanalysis;Microscopy;Opticalinstruments;Scaling;Transmission
【摘要】:ThisInternationalStandardspecifiesthemethodofselected-areaelectrondiffraction(SAED)analysisusingatransmissionelectronmicroscope(TEM)toanalysemicrometerandsub-micrometersizedareasofthincrystallinespecimens.Suchspecimenscanbeobtainedintheformofthinsectionsfromavarietyofmetallicandnon-metallicmaterials,aswellasfinepowders,oralternativelybytheuseofextractionreplicas.Theminimumdiameteroftheselectedareainaspecimenwhichcanbeanalysedbythismethoddependsonthesphericalaberrationcoefficientoftheobjectivelensofthemicroscopeandapproaches0,5μmforamodernTEM.Whenthediameterofananalysedspecimenareaissmallerthan0,5μm,theanalysisprocedurecanalsobereferredtothisInternationalStandardbut,becauseoftheeffectofsphericalaberration,someofthediffractioninformationinthepatterncanbegeneratedfromoutsideoftheareadefinedbytheselected-areaaperture.Insuchcases,theuseofmicrodiffractionorconvergentbeamelectrondiffraction,whereavailable,mightbepreferred.Thesuccessoftheselected-areaelectrondiffractionmethodreliesonthevalidityofindexingthediffractionpatternsarising,irrespectiveofwhichaxisinthespecimenliesparalleltotheincidentelectronbeam.Suchanalysisisthereforeaidedbyspecimentiltandrotationfacilities.ThisInternationalStandardisapplicabletoacquisitionofSAEDpatternsfromcrystallinespecimens,indexingthepatternsandcalibrationofthediffractionconstant.
【中国标准分类号】:N33
【国际标准分类号】:71_040_50
【页数】:36P.;A4
【正文语种】:英语
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